To verify manufacturing yield by testing

Keyphrases

• Defect Density 100%
• Manufacturing Yield 100%
• Analysis Procedure 50%
• Chip Area 50%
• ASIC Design 50%
• Circuit Design 50%
• Test Yield 50%
• Yield Analysis 50%
• Production Test 50%
• Design Centering 50%
• Wafer Sort 50%
• Production Run 50%
• Yield Data 50%
• Chip Yield 50%
• Yield Modeling 50%

Engineering

• Engineering 100%
• Application Specific Integrated Circuit 100%
• Defect Density 100%
• Chip Area 50%
• Circuit Design 50%

Material Science

• Defect Density 100%
• Electronic Circuit 50%