THz acoustic spectroscopy based on GaN nanostructures

Kung Hsuan Lin; Dzung Han Tsai; Kuan Jen Wang; Sheng Hui Chen; Kai Lun Chi; Jin Wei Shi; Po Cheng Chen; Jinn Kong Sheu

doi:10.1117/12.2036171

THz acoustic spectroscopy based on GaN nanostructures

Kung Hsuan Lin, Dzung Han Tsai, Kuan Jen Wang, Sheng Hui Chen, Kai Lun Chi, Jin Wei Shi, Po Cheng Chen, Jinn Kong Sheu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to THz regime. The acoustic properties of silica thin films prepared by chemical deposition methods were characterized in the sub-THz regime. This technique may be useful in resolving debated issues relating to Boson peak around 1 THz.

Original language	English
Title of host publication	Ultrafast Phenomena and Nanophotonics XVIII
DOIs	https://doi.org/10.1117/12.2036171
State	Published - 2014
Event	Ultrafast Phenomena and Nanophotonics XVIII - San Francisco, CA, United States Duration: 2 Feb 2014 → 5 Feb 2014

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8984
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Ultrafast Phenomena and Nanophotonics XVIII
Country/Territory	United States
City	San Francisco, CA
Period	2/02/14 → 5/02/14

Keywords

GaN
acoustic spectroscopy
glass
ultrafast spectroscopy

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10.1117/12.2036171

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title = "THz acoustic spectroscopy based on GaN nanostructures",

abstract = "Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to THz regime. The acoustic properties of silica thin films prepared by chemical deposition methods were characterized in the sub-THz regime. This technique may be useful in resolving debated issues relating to Boson peak around 1 THz.",

keywords = "GaN, acoustic spectroscopy, glass, ultrafast spectroscopy",

author = "Lin, {Kung Hsuan} and Tsai, {Dzung Han} and Wang, {Kuan Jen} and Chen, {Sheng Hui} and Chi, {Kai Lun} and Shi, {Jin Wei} and Chen, {Po Cheng} and Sheu, {Jinn Kong}",

year = "2014",

doi = "10.1117/12.2036171",

language = "???core.languages.en_GB???",

isbn = "9780819498977",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Ultrafast Phenomena and Nanophotonics XVIII",

note = "Ultrafast Phenomena and Nanophotonics XVIII ; Conference date: 02-02-2014 Through 05-02-2014",

}

Lin, KH, Tsai, DH, Wang, KJ, Chen, SH, Chi, KL, Shi, JW, Chen, PC & Sheu, JK 2014, THz acoustic spectroscopy based on GaN nanostructures. in Ultrafast Phenomena and Nanophotonics XVIII., 89840C, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8984, Ultrafast Phenomena and Nanophotonics XVIII, San Francisco, CA, United States, 2/02/14. https://doi.org/10.1117/12.2036171

TY - GEN

T1 - THz acoustic spectroscopy based on GaN nanostructures

AU - Lin, Kung Hsuan

AU - Tsai, Dzung Han

AU - Wang, Kuan Jen

AU - Chen, Sheng Hui

AU - Chi, Kai Lun

AU - Shi, Jin Wei

AU - Chen, Po Cheng

AU - Sheu, Jinn Kong

PY - 2014

Y1 - 2014

N2 - Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to THz regime. The acoustic properties of silica thin films prepared by chemical deposition methods were characterized in the sub-THz regime. This technique may be useful in resolving debated issues relating to Boson peak around 1 THz.

AB - Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to THz regime. The acoustic properties of silica thin films prepared by chemical deposition methods were characterized in the sub-THz regime. This technique may be useful in resolving debated issues relating to Boson peak around 1 THz.

KW - GaN

KW - acoustic spectroscopy

KW - glass

KW - ultrafast spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=84898062152&partnerID=8YFLogxK

U2 - 10.1117/12.2036171

DO - 10.1117/12.2036171

M3 - 會議論文篇章

AN - SCOPUS:84898062152

SN - 9780819498977

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Ultrafast Phenomena and Nanophotonics XVIII

T2 - Ultrafast Phenomena and Nanophotonics XVIII

Y2 - 2 February 2014 through 5 February 2014

ER -

THz acoustic spectroscopy based on GaN nanostructures

Abstract

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Keywords

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