Abstract
An electric-field-induced second-harmonic-generation signal in a nematic liquid crystal is used to map the electric field in an integrated-circuit-like sample. Since the electric-field-induced second-harmonic-generation signal intensity exhibits a strong dependence on the polarization of the incident laser beam, both the amplitude and the orientation of the electric field vectors can be measured. Combined with scanning second-harmonic-generation microscopy, three-dimensional electric field distribution can be easily visualized with high spatial resolution of the order of 1 μm.
| Original language | English |
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| Pages (from-to) | 1338-1340 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 28 |
| Issue number | 15 |
| DOIs | |
| State | Published - 1 Aug 2003 |