Thermally formed oxide films on Al-XSi alloys heated in different gases

Teng Shih Shih; Po Chen Chen; Chi Chou Huang

doi:10.1007/s11085-008-9112-3

Thermally formed oxide films on Al-XSi alloys heated in different gases

Teng Shih Shih, Po Chen Chen, Chi Chou Huang

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Thermogravimetric analysis (TGA) testing was used to measure the change in weight of polished samples of Al-XSi (X = 0 and 1.2 mass%) alloys. The samples were heated at 843 K for 6 h in dry air or nitrogen gas. X-ray diffraction was used to monitor the formation of the oxide films on the surface of the samples. The surface oxide films were more compact after the Al alloy samples were heated in air, and the oxide films showed some cracks after being heated in nitrogen gas. The thermally formed surface oxide films on the Al-1.2 mass% Si alloy samples heated in air and in nitrogen gas possessed loose structures, which comprised mainly γ-alumina, diaspore, and gibbsite, along with metallic silicon and/or aluminum. The weight variation curve of the films appeared serrated; this can be attributed to chain reactions (3Si + 3O ₂ → 3SiO ₂ + 4Al → 3Si + 2Al ₂O ₃) that occurred within the film.

Original language	English
Pages (from-to)	69-83
Number of pages	15
Journal	Oxidation of Metals
Volume	70
Issue number	1-2
DOIs	https://doi.org/10.1007/s11085-008-9112-3
State	Published - Aug 2008

Keywords

AlN
C-Alumina
Diaspore
Gibbsite
Oxide film

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title = "Thermally formed oxide films on Al-XSi alloys heated in different gases",

abstract = "Thermogravimetric analysis (TGA) testing was used to measure the change in weight of polished samples of Al-XSi (X = 0 and 1.2 mass%) alloys. The samples were heated at 843 K for 6 h in dry air or nitrogen gas. X-ray diffraction was used to monitor the formation of the oxide films on the surface of the samples. The surface oxide films were more compact after the Al alloy samples were heated in air, and the oxide films showed some cracks after being heated in nitrogen gas. The thermally formed surface oxide films on the Al-1.2 mass% Si alloy samples heated in air and in nitrogen gas possessed loose structures, which comprised mainly γ-alumina, diaspore, and gibbsite, along with metallic silicon and/or aluminum. The weight variation curve of the films appeared serrated; this can be attributed to chain reactions (3Si + 3O 2 → 3SiO 2 + 4Al → 3Si + 2Al 2O 3) that occurred within the film.",

keywords = "AlN, C-Alumina, Diaspore, Gibbsite, Oxide film",

author = "Shih, {Teng Shih} and Chen, {Po Chen} and Huang, {Chi Chou}",

note = "Funding Information: Acknowledgement The authors would like to thank the National Science Council for providing financial support for this study (NSC95-2221-E-008-040).",

year = "2008",

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volume = "70",

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TY - JOUR

T1 - Thermally formed oxide films on Al-XSi alloys heated in different gases

AU - Shih, Teng Shih

AU - Chen, Po Chen

AU - Huang, Chi Chou

N1 - Funding Information: Acknowledgement The authors would like to thank the National Science Council for providing financial support for this study (NSC95-2221-E-008-040).

PY - 2008/8

Y1 - 2008/8

N2 - Thermogravimetric analysis (TGA) testing was used to measure the change in weight of polished samples of Al-XSi (X = 0 and 1.2 mass%) alloys. The samples were heated at 843 K for 6 h in dry air or nitrogen gas. X-ray diffraction was used to monitor the formation of the oxide films on the surface of the samples. The surface oxide films were more compact after the Al alloy samples were heated in air, and the oxide films showed some cracks after being heated in nitrogen gas. The thermally formed surface oxide films on the Al-1.2 mass% Si alloy samples heated in air and in nitrogen gas possessed loose structures, which comprised mainly γ-alumina, diaspore, and gibbsite, along with metallic silicon and/or aluminum. The weight variation curve of the films appeared serrated; this can be attributed to chain reactions (3Si + 3O 2 → 3SiO 2 + 4Al → 3Si + 2Al 2O 3) that occurred within the film.

AB - Thermogravimetric analysis (TGA) testing was used to measure the change in weight of polished samples of Al-XSi (X = 0 and 1.2 mass%) alloys. The samples were heated at 843 K for 6 h in dry air or nitrogen gas. X-ray diffraction was used to monitor the formation of the oxide films on the surface of the samples. The surface oxide films were more compact after the Al alloy samples were heated in air, and the oxide films showed some cracks after being heated in nitrogen gas. The thermally formed surface oxide films on the Al-1.2 mass% Si alloy samples heated in air and in nitrogen gas possessed loose structures, which comprised mainly γ-alumina, diaspore, and gibbsite, along with metallic silicon and/or aluminum. The weight variation curve of the films appeared serrated; this can be attributed to chain reactions (3Si + 3O 2 → 3SiO 2 + 4Al → 3Si + 2Al 2O 3) that occurred within the film.

KW - AlN

KW - C-Alumina

KW - Diaspore

KW - Gibbsite

KW - Oxide film

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U2 - 10.1007/s11085-008-9112-3

DO - 10.1007/s11085-008-9112-3

M3 - 期刊論文

AN - SCOPUS:47149115083

SN - 0030-770X

VL - 70

SP - 69

EP - 83

JO - Oxidation of Metals

JF - Oxidation of Metals

IS - 1-2

ER -

Thermally formed oxide films on Al-XSi alloys heated in different gases

Abstract

Keywords

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