The understanding of gate capacitance matching on achieving a high performance NC MOSFET with sufficient mobility

C. K. Chiang, P. Husan, Y. C. Lou, F. L. Li, E. R. Hsieh, C. H. Liu, Steve S. Chung

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Material Science

Engineering

Computer Science

Agricultural and Biological Sciences