The pore size analysis of mesoporous films by krypton adsorption

K. Chao; H. Ping; C. Chiu; A. S.T. Chiang

doi:10.1016/s0167-2991(04)80650-5

The pore size analysis of mesoporous films by krypton adsorption

K. Chao, H. Ping, C. Chiu, A. S.T. Chiang

Department of Chemical and Materials Engineering

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

The pore structure of mesoporous membranes coated on silicon wafer was characterized by the adsorption of krypton at 77 K in this study. To establish the capillary condensation and evaporation conditions for krypton at this temperature, the adsorption of both nitrogen and krypton were first measured on a series of siliceous MCM-41, MCM-48 and SBA-15 reference samples. The adsorption and desorption transition of krypton were then correlated with the pore size deduced from the nitrogen isotherm. Finally, the obtained correlation was applied to estimate the pore size distribution of mesoporous films.

Original language	English
Pages (from-to)	1363-1368
Number of pages	6
Journal	Studies in Surface Science and Catalysis
Volume	154 B
DOIs	https://doi.org/10.1016/s0167-2991(04)80650-5
State	Published - 2004

Keywords

Krypton adsorption
Mesoporous film
Pore size analysis

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title = "The pore size analysis of mesoporous films by krypton adsorption",

abstract = "The pore structure of mesoporous membranes coated on silicon wafer was characterized by the adsorption of krypton at 77 K in this study. To establish the capillary condensation and evaporation conditions for krypton at this temperature, the adsorption of both nitrogen and krypton were first measured on a series of siliceous MCM-41, MCM-48 and SBA-15 reference samples. The adsorption and desorption transition of krypton were then correlated with the pore size deduced from the nitrogen isotherm. Finally, the obtained correlation was applied to estimate the pore size distribution of mesoporous films.",

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T1 - The pore size analysis of mesoporous films by krypton adsorption

AU - Chao, K.

AU - Ping, H.

AU - Chiu, C.

AU - Chiang, A. S.T.

PY - 2004

Y1 - 2004

N2 - The pore structure of mesoporous membranes coated on silicon wafer was characterized by the adsorption of krypton at 77 K in this study. To establish the capillary condensation and evaporation conditions for krypton at this temperature, the adsorption of both nitrogen and krypton were first measured on a series of siliceous MCM-41, MCM-48 and SBA-15 reference samples. The adsorption and desorption transition of krypton were then correlated with the pore size deduced from the nitrogen isotherm. Finally, the obtained correlation was applied to estimate the pore size distribution of mesoporous films.

AB - The pore structure of mesoporous membranes coated on silicon wafer was characterized by the adsorption of krypton at 77 K in this study. To establish the capillary condensation and evaporation conditions for krypton at this temperature, the adsorption of both nitrogen and krypton were first measured on a series of siliceous MCM-41, MCM-48 and SBA-15 reference samples. The adsorption and desorption transition of krypton were then correlated with the pore size deduced from the nitrogen isotherm. Finally, the obtained correlation was applied to estimate the pore size distribution of mesoporous films.

KW - Krypton adsorption

KW - Mesoporous film

KW - Pore size analysis

UR - http://www.scopus.com/inward/record.url?scp=11844253180&partnerID=8YFLogxK

U2 - 10.1016/s0167-2991(04)80650-5

DO - 10.1016/s0167-2991(04)80650-5

M3 - 期刊論文

AN - SCOPUS:11844253180

SN - 0167-2991

VL - 154 B

SP - 1363

EP - 1368

JO - Studies in Surface Science and Catalysis

JF - Studies in Surface Science and Catalysis

ER -

The pore size analysis of mesoporous films by krypton adsorption

Abstract

Keywords

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