Abstract
The microstructure and magnetic properties of the amorphous Co-Fe-Zr-B thin films grown on glass substrates by dc magnetron sputtering are investigated using differential scanning calorimetry (DSC), transmission electron microscopy (TEM), and superconducting quantum interference device (SQUID) techniques. The Co-Fe-Zr-B thin films deposited at room temperature were annealed at temperatures ranged from 683 K to 773 K. Experimental results indicated that the coercivity (H c) of the Co-Fe-Zr-B thin films is significantly influenced by residual stress and crystalline phases within the films. The correlation of the coercivity and the microstructure of Co-Fe-Zr-B thin films are discussed. After annealed at 683 K, the coercivity of the Co-Fe-Zr-B film was as low as 1.2 Oe.
Original language | English |
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Pages (from-to) | 127-131 |
Number of pages | 5 |
Journal | Intermetallics |
Volume | 30 |
DOIs | |
State | Published - Nov 2012 |
Keywords
- B. Glasses, metallic
- B. Magnetic properties
- B. Thermal stability
- F. Calorimetry
- F. Microscopy