The development of synchrotron-assisted scanning probe microscopy at NSRRC

Yuet Loy Chan, Xihui Liang, Tsung Hsuan Wu, Dah An Lu, Meng Fan Luo, Yao Jane Hsu, D. H. Wei

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations


Synchrotron-based X-ray microspectroscopy is a technique that brings together microscopy and X-ray spectroscopy. It can be considered as an experimental approach capable of extracting X-ray spectrum from a finite area, or an alternative way of constructing images with spectroscopic contrast. The goal of this project is to integrate the functions of scanning tunnelling electron microscope (STM) with near edge X-ray absorption fine structure (NEXAFS) spectroscopy. Here, we describe our experimental setup, followed by recent results that demonstrate the feasibility of acquiring NEXAFS spectrum with a SiO2 coated STM tip.

Original languageEnglish
Article number012035
JournalJournal of Physics: Conference Series
Issue number1
StatePublished - 2013
Event11th International Conference on X-Ray Microscopy, XRM 2012 - Shanghai, China
Duration: 5 Aug 201210 Aug 2012


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