The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing

Chung Huang Yeh, Jwu E. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

This study aims to exploit an integrated-circuit (IC) testing model based on a statistical simulation method to evaluate the test yield and quality of IC products. Using normal probability distributions of product properties, we digitally analyzed IC yield and quality, introduced testing threshold and guardband, and assessed various parameters' influence on outcomes. Because future manufacturing speed is unpredictable, we used current manufacturing technology and existing-product electrical properties to estimate future product-distribution trends. Since the progress of developmental improvements for testing technologies has been slow, it has become a greater challenge for a supplier to determine the use of existing instruments and tools to achieve quality products with near-zero defects. To improve product quality, a new scheme of Multiple tests has been proposed. Moreover, we used a set of parameters from the International Technology Roadmap for Semiconductors (ITRS) to demonstrate the proposed Multiple testing, and to show that the test yield can be improved while attaining the desired quality.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages88-93
Number of pages6
ISBN (Electronic)9781728189444
DOIs
StatePublished - Sep 2020
Event4th IEEE International Test Conference in Asia, ITC-Asia 2020 - Taipei, Taiwan
Duration: 23 Sep 202025 Sep 2020

Publication series

NameProceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020

Conference

Conference4th IEEE International Test Conference in Asia, ITC-Asia 2020
Country/TerritoryTaiwan
CityTaipei
Period23/09/2025/09/20

Keywords

  • defect level
  • guardband test
  • test errors
  • test quality
  • test specification

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