Fingerprint
Dive into the research topics of 'The ballistic transport and reliability of the SOI and strained-SOI nMOSFETs with 65nm node and beyond technology'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
E. R. Hsieh, Derrick W. Chang, S. S. Chung, Y. H. Lin, C. H. Tsai, C. T. Tsai, G. H. Ma
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review