Testing stuck-open faults of priority address encoder in content addressable memories

Tsai Ling Tsai, Jin Fu Li, Chun Lung Hsu, Chi Tien Su

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Content addressable memory (CAM) is widely used in the systems with the need of parallel search. The testing of CAM is more difficult than that of random access memory (RAM) due to the complicated function of CAM. Similar to the testing of RAM, the testing of CAM should cover the cell array and peripheral circuits. In this paper, we propose a March-like test, March-PCL, for detecting the stuck-open faults (SOFs) of the priority address encoder of CAMs. As the best of our knowledge, this is the first word to discuss the testing of SOFs of the priority address encoder of CAMs. The March-PCL requires 4N Write and 4N Compare operations to cover 100% SOFs.

Original languageEnglish
Title of host publicationASP-DAC 2019 - 24th Asia and South Pacific Design Automation Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages382-387
Number of pages6
ISBN (Electronic)9781450360074
DOIs
StatePublished - 21 Jan 2019
Event24th Asia and South Pacific Design Automation Conference, ASPDAC 2019 - Tokyo, Japan
Duration: 21 Jan 201924 Jan 2019

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference24th Asia and South Pacific Design Automation Conference, ASPDAC 2019
Country/TerritoryJapan
CityTokyo
Period21/01/1924/01/19

Keywords

  • Comparison faults
  • Content addressable memories
  • Memory testing
  • Priority encoder faults

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