Abstract
This paper presents a march-like test TAC-P to cover comparison faults of ternary content addressable memories (TCAMs) with asymmetric cells. The TAC-P only requires 4N Write operations and (3N + 2B) Compare operations for an N×B-bit TCAM with Hit and priority address encoder outputs. We show that the test also can cover search time failures induced by process variation in the comparison circuit of a TCAM. Furthermore, a test TMF for match failures induced by the process variation in the comparison circuit of a TCAM is also presented.
Original language | English |
---|---|
Article number | 5605326 |
Pages (from-to) | 1843-1847 |
Number of pages | 5 |
Journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Volume | 29 |
Issue number | 11 |
DOIs | |
State | Published - Nov 2010 |
Keywords
- Comparison faults
- content addressable memories
- march tests
- memory testing