Testing random defect and process variation induced comparison faults of TCAMs with asymmetric cells

Jin Fu Li, Yu Jen Huang, Yong Jyun Hu

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

This paper presents a march-like test TAC-P to cover comparison faults of ternary content addressable memories (TCAMs) with asymmetric cells. The TAC-P only requires 4N Write operations and (3N + 2B) Compare operations for an N×B-bit TCAM with Hit and priority address encoder outputs. We show that the test also can cover search time failures induced by process variation in the comparison circuit of a TCAM. Furthermore, a test TMF for match failures induced by the process variation in the comparison circuit of a TCAM is also presented.

Original languageEnglish
Article number5605326
Pages (from-to)1843-1847
Number of pages5
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume29
Issue number11
DOIs
StatePublished - Nov 2010

Keywords

  • Comparison faults
  • content addressable memories
  • march tests
  • memory testing

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