Testing Inter-Word Coupling Faults of Wide I/O DRAMs

Che Wei Chou, Yong Xiao Chen, Jin Fu Li

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


Wide-I/O dynamic random access memory (wide I/O DRAM) is one of promising solutions to increase the memory bandwidth. Similar to modern double-data-rate DRAMs, the minimum burst length of wide I/O DRAM is at least two. Thus, either a read or a write operation is executed, two words will be read or written at least each time. This causes that the testing of inter-word coupling faults becomes complicated. In this paper, we propose a method to modify conventional March tests into modified March tests which can fully cover inter-word coupling faults of wide I/O DRAMs with minimum burst length of two and programmable burst order. Furthermore, the test complexity of modified March tests for different burst lengths is analyzed. Results show that the test time of modified March tests is the shortest if the longest burst length is set to apply the modified March tests. Results of fault coverage analysis show that the modified March test can provide 100% fault coverage of simple inter-word coupling faults.

Original languageEnglish
Title of host publicationProceedings - 2015 24th IEEE Asian Test Symposium, ATS 2015
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)9781467397391
StatePublished - 28 Feb 2015
Event24th IEEE Asian Test Symposium, ATS 2015 - Mumbai, Maharashtra, India
Duration: 22 Nov 201525 Nov 2015

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735


Conference24th IEEE Asian Test Symposium, ATS 2015
CityMumbai, Maharashtra


  • burst length
  • coupling faults
  • DRAM
  • fault coverage
  • March test


Dive into the research topics of 'Testing Inter-Word Coupling Faults of Wide I/O DRAMs'. Together they form a unique fingerprint.

Cite this