Ternary content addressable memory (TCAM) is one key component in the dedicated hardware modulars for high-performance networking applications. Symmetric and asymmetric cells are two widely used cell structures in TCAMs. An asymmetric cell consists of a binary content addressable memory (BCAM) bit and a mask bit. This paper proposes two march-like test algorithms, THit and TPAE, to cover the comparison faults of the BCAM cell and the comparison logic faults of the masking cell. THit requires 7N Write operations and (3N+2B) Compare operations to cover the comparison faults of an N × B-bit TCAM with Hit output only. TPAE requires 4N Write operations and (3N+2B) Compare operations to cover the comparison faults of an V × B-bit TCAM with priority address encoder (PAE) output.