Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

With the increasing demand for high-performance networking application, network components such as network interfaces and routers are built in dedicated hardware mod-ulars. Content addressable memories (CAMs) play an important rote in the network components. Testing CAMs is very complicated due to their special structure. This paper presents an efficient March-like test algorithm for detecting the comparison faults of ternary CAMs based on the comparison fault models of binary CAMs. The test algorithm requires 5N Write operations, 2N Erase operations, and (3N+2B) Compare operations for an N×B-bit TCAM.

Original languageEnglish
Title of host publicationProceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages65-70
Number of pages6
ISBN (Print)0780387368, 9780780387362
DOIs
StatePublished - 2005
Event2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 - Shanghai, China
Duration: 18 Jan 200521 Jan 2005

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume1

Conference

Conference2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
Country/TerritoryChina
CityShanghai
Period18/01/0521/01/05

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