Testing and Reliability of Computing-In Memories: Solutions and Challenges

Jin Fu Li

doi:10.1109/ITCAsia55616.2022.00020

Testing and Reliability of Computing-In Memories: Solutions and Challenges

Jin Fu Li

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

9 Scopus citations

Abstract

Various computing-in-memory designs have been proposed as a possible computing architecture for the data-centric computing applications. Existing memories such as random access memories, flash memories, and emerging memories can be modified as computing-in-memories (CIMs) to support computing operations. In CIMs, computing operations typically are more complex and have smaller sensing margin than the read operation. Furthermore, storage devices of emerging memories are more unreliable than transistors. Those make the testing and reliability of CIMs become worse. In this paper, we first review existing testing and reliability-enhancement methods for CIMs. Then, testing and reliability challenges of CIMs are discussed.

Original language	English
Title of host publication	Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	55-60
Number of pages	6
ISBN (Electronic)	9781665455237
DOIs	https://doi.org/10.1109/ITCAsia55616.2022.00020
State	Published - 2022
Event	6th IEEE International Test Conference in Asia, ITC-Asia 2022 - Taipei, Taiwan Duration: 24 Aug 2022 → 26 Aug 2022

Publication series

Name	Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022

Conference

Conference	6th IEEE International Test Conference in Asia, ITC-Asia 2022
Country/Territory	Taiwan
City	Taipei
Period	24/08/22 → 26/08/22

Keywords

RAM
RRNM
STT-MRAM
computing in memory
reliability
test

Access to Document

10.1109/ITCAsia55616.2022.00020

應用於運算記憶體之前瞻可靠度及測試框架-總計畫暨子計畫一：應用於運算記憶體之測試技術
Li, J.-F. (PI)
1/08/22 → 31/07/23
Project: Research

Cite this

Li, J. F. (2022). Testing and Reliability of Computing-In Memories: Solutions and Challenges. In Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022 (pp. 55-60). (Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ITCAsia55616.2022.00020

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Li, JF 2022, Testing and Reliability of Computing-In Memories: Solutions and Challenges. in Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022. Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022, Institute of Electrical and Electronics Engineers Inc., pp. 55-60, 6th IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, 24/08/22. https://doi.org/10.1109/ITCAsia55616.2022.00020

Testing and Reliability of Computing-In Memories: Solutions and Challenges. / Li, Jin Fu.
Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022. Institute of Electrical and Electronics Engineers Inc., 2022. p. 55-60 (Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Testing and Reliability of Computing-In Memories: Solutions and Challenges

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Keywords

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應用於運算記憶體之前瞻可靠度及測試框架-總計畫暨子計畫一：應用於運算記憶體之測試技術

Cite this