Testing active neighborhood pattern-sensitive faults of ternary content addressable memories

Yu Jen Huang, Jin Fu Li

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

With the shrinking feature size and the growing density, testing neighborhood pattern-sensitive faults (NPSFs) of integrated circuits is more and more important, especially testing NPSFs of semiconductor memories. This paper presents a test algorithm for detecting the active NPSFs (ANPSFs) in ternary content addressable memories (TCAMs). Due to the special TCAM cell structure, unique test algorithm with only march-based test operations or only two-group test operations is not efficient. We propose a test methodology with both march-based and two-group tests to cover 100% ANPSFs in TCAMs. The total test complexity is 156N for an N×K-bit TCAM. Also, no TCAM circuit modification is needed to support the proposed test methodology.

Original languageEnglish
Title of host publicationProceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006
Pages55-60
Number of pages6
DOIs
StatePublished - 2006
Event11th IEEE European Test Symposium, ETS 2006 - Southampton, United Kingdom
Duration: 21 May 200621 May 2006

Publication series

NameProceedings - Eleventh IEEE European Test Symposium, ETS 2006
Volume2006

Conference

Conference11th IEEE European Test Symposium, ETS 2006
Country/TerritoryUnited Kingdom
CitySouthampton
Period21/05/0621/05/06

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