Temperature dependence of two beam coupling, light-induced erasure decay and dark decay in As-grown and reduced BaTiO3:Rh

J. Y. Chang, C. Y. Huang, C. F. Chu, J. M. Wang, C. C. Sun

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Abstract

Two beam coupling, light-induced erasure decay and dark decay are investigated in as-grown and reduced BaTiO3:Rh as a function of temperature. The photorefractive sensitivity increases with temperature, mainly due to the increase of the speed. As deduced from the dark decay measurement, the shallow trap effect decreases while the dark conductivity increases with increasing temperature. These two factors determine how the two beam coupling gain depends on intensity and the intensity dependence power coefficient with response time varies as temperature increases. For the as-grown sample, the photorefractive properties are controlled by the competition between deep and shallow levels when the temperature is below 60°C. Above 60°C, large dark conductivity plays a dominant role. For the sample reduced at an atmosphere of 10-10 atm oxygen partial pressure, the photorefractive properties are controlled by the competition between deep and shallow traps from room temperature to 100°C. For the sample reduced at an atmosphere of 10-14 atm oxygen partial pressure, the photorefractive properties are mainly dependent on the dark conductivity though it has a high photoconductivity.

Original languageEnglish
Pages (from-to)5357-5362
Number of pages6
JournalJapanese Journal of Applied Physics
Volume40
Issue number9 A
DOIs
StatePublished - Sep 2001

Keywords

  • BaTiO
  • Photorefraction
  • Temperature dependence
  • Two beam coupling

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