Subwavelength Si nanowire arrays for self-cleaning antireflection coatings

  • Yu An Dai
  • , Hung Chih Chang
  • , Kun Yu Lai
  • , Chin An Lin
  • , Ren Jei Chung
  • , Gong Ru Lin
  • , Jr Hau He

Research output: Contribution to journalArticlepeer-review

83 Scopus citations

Abstract

Galvanic wet etching was adopted to fabricate Si nanowire arrays (NWAs) as a near-perfect subwavelength structure (SWS), which is an optically effective gradient-index antireflection (AR) surface and also exhibits super-hydrophobicity with an extremely high water contact angle (159°). Fresnel reflection and diffuse reflection over the broad spectrum can be eliminated by a Si NWA AR coating. Moreover, Si NWA SWSs show polarization-independent and omnidirectional AR properties. The wavelength-averaged specular and diffuse reflectance of Si NWA SWSs are as low as 0.06% and 2.51%, respectively. The effects of the surface profile of this biomimetic SWS on the AR and super-hydrophobic properties were investigated systematically.

Original languageEnglish
Pages (from-to)10924-10930
Number of pages7
JournalJournal of Materials Chemistry
Volume20
Issue number48
DOIs
StatePublished - 28 Dec 2010

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