The optical properties of In0.52(AlxGa1-x)0.48As epilayers with various x values were systematically studied using variable angle spectroscopic ellipsometry in the wavelength range of 310-1700 nm. The refractive indexes were determined. The energies and broadening parameters of the E1 and E1+Δ1 transitions as a function of Al composition were also examined based on the second-derivative spectra of the dielectric function. The comparison between our results and the reported data is presented.
|Number of pages||4|
|Journal||Conference Proceedings - International Conference on Indium Phosphide and Related Materials|
|State||Published - 1995|
|Event||Proceedings of the 7th International Conference on Indium Phosphide and Related Materials - Sapporo, Jpn|
Duration: 9 May 1995 → 13 May 1995