@inproceedings{454f9cb758344ab8931bab1a1415896d,
title = "Study of efficiency-droop mechanism in vertical red light-emitting diodes using electrical-to-optical impulse responses",
abstract = "The mechanism responsible for the efficiency droop in AlGaInP based vertically-structured red light-emitting diodes (LEDs) is investigated using dynamic measurement techniques. Short electrical pulses (∼100ps) are pumped into this device and the output optical pulses probed using high-speed photo-receiver circuits. From this, the internal carrier dynamic inside the device can be investigated by use of the measured electrical-to-optical (E-O) impulse responses. Results show that the E-O responses measured under different bias currents are all invariant from room temperature to ∼100°. This is contrary to most results reported for AlGaInP based red LEDs, which usually exhibit a shortening in the response time and degradation in output power with the increase of ambient temperature. According to these measurement results and the extracted fall-time constants of the E-O impulse responses, the origin of the efficiency droop in our vertical LED structure, which has good heat-sinking, is not due to thermally induced carrier leakage, but rather should be attributed to defect recombination and the saturation of spontaneous recombination processes.",
keywords = "AlGaInP, E-O impulse responses, Light-emitting diodes, efficiency-droop",
author = "Shi, {J. W.} and Kuo, {F. M.} and Lin, {Che Wei} and Wei Chen and Lee, {M. L.} and Yan, {L. J.} and Sheu, {J. K.}",
year = "2012",
doi = "10.1117/12.906990",
language = "???core.languages.en_GB???",
isbn = "9780819489210",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Light-Emitting Diodes",
note = "Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVI ; Conference date: 24-01-2012 Through 26-01-2012",
}