Abstract
A new method is introduced to evaluate the specific series resistance distribution of solar cells using photoluminescence images under both short circuit and open circuit conditions. An experiment was perfomed to confirm that method is insensitive to the illumination intensity distribution and valid for different illumination levels.
Original language | English |
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Pages (from-to) | A822-A827 |
Journal | Optics Express |
Volume | 20 |
Issue number | 106 |
DOIs | |
State | Published - 5 Nov 2012 |