Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs

Tsung Fu Hsieh, Jin Fu Li, Kuan Te Wu, Jenn Shiang Lai, Chih Yen Lo, Ding Ming Kwai, Yung Fa Chou

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

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