Small angle X-ray scattering studies of poly(3-octylthiophene) and poly(3,3″-dioctyl-2,2″,5′2″-terthiophene) polymer thin films

N. Narsimlu; K. Siva Kumar; Chu En Wu; Chun Guey Wu

doi:10.1016/j.matlet.2003.07.048

Small angle X-ray scattering studies of poly(3-octylthiophene) and poly(3,3″-dioctyl-2,2″,5′2″-terthiophene) polymer thin films

N. Narsimlu, K. Siva Kumar, Chu En Wu, Chun Guey Wu

Department of Chemistry

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Small angle X-ray scattering (SAXS) experimental technique is applied in obtaining the macromolecular parameters (radius of gyration R_g, radius R, specific surface area S_s and surface fractal dimension) of two polythiophene derivatives, poly(3-octylthiophene) (POTH) and poly(3,3″-dioctyl-2,2″,5′2″-terthiphene) (POTTOT) thin films. Nanosized thin films of these two polymers were prepared on glass substrate with thickness around 3.5 μm by spin coating. SAXS experiments are performed with a 18-kW rotating anode X-ray generator equipped with a Cu target. A two-dimensional proportional counter is employed to detect the scattered X-rays intensity. Analyses of SAXS data using the Guinier approximation of the radius of gyration of POTH and POTTOT particles are determined as 10.73 and 9. 99 Å, respectively. Porod approximation is used to find specific surface area of POTH and POTTOT nanostructured polymeric thin films, and they are determined as 3.61×10⁸ and 3.00×10⁸ cm ^-1, respectively. The surface fractal dimension of POTH and POTTOT thin films are calculated as 2.85 and 2.65, respectively.

Original language	English
Pages (from-to)	1113-1116
Number of pages	4
Journal	Materials Letters
Volume	58
Issue number	6
DOIs	https://doi.org/10.1016/j.matlet.2003.07.048
State	Published - Feb 2004

Keywords

Polythiophene
Radius of gyration
SAXS
Specific surface area

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@article{d0e75e97dd3b4e0ca520f40865c5e66f,

title = "Small angle X-ray scattering studies of poly(3-octylthiophene) and poly(3,3″-dioctyl-2,2″,5′2″-terthiophene) polymer thin films",

abstract = "Small angle X-ray scattering (SAXS) experimental technique is applied in obtaining the macromolecular parameters (radius of gyration Rg, radius R, specific surface area Ss and surface fractal dimension) of two polythiophene derivatives, poly(3-octylthiophene) (POTH) and poly(3,3″-dioctyl-2,2″,5′2″-terthiphene) (POTTOT) thin films. Nanosized thin films of these two polymers were prepared on glass substrate with thickness around 3.5 μm by spin coating. SAXS experiments are performed with a 18-kW rotating anode X-ray generator equipped with a Cu target. A two-dimensional proportional counter is employed to detect the scattered X-rays intensity. Analyses of SAXS data using the Guinier approximation of the radius of gyration of POTH and POTTOT particles are determined as 10.73 and 9. 99 {\AA}, respectively. Porod approximation is used to find specific surface area of POTH and POTTOT nanostructured polymeric thin films, and they are determined as 3.61×108 and 3.00×108 cm -1, respectively. The surface fractal dimension of POTH and POTTOT thin films are calculated as 2.85 and 2.65, respectively.",

keywords = "Polythiophene, Radius of gyration, SAXS, Specific surface area",

author = "N. Narsimlu and {Siva Kumar}, K. and Wu, {Chu En} and Wu, {Chun Guey}",

note = "Funding Information: Financial assistance from the National Science Council (NSC) of Taiwan, ROC is sincerely acknowledged. The authors are thankful to B. Kavitha for helping in preparation of manuscript. One of the authors, N. Narsimlu, is thankful to CMR College Management for giving Associate professorship. ",

year = "2004",

month = feb,

doi = "10.1016/j.matlet.2003.07.048",

language = "???core.languages.en_GB???",

volume = "58",

pages = "1113--1116",

journal = "Materials Letters",

issn = "0167-577X",

number = "6",

}

TY - JOUR

T1 - Small angle X-ray scattering studies of poly(3-octylthiophene) and poly(3,3″-dioctyl-2,2″,5′2″-terthiophene) polymer thin films

AU - Narsimlu, N.

AU - Siva Kumar, K.

AU - Wu, Chu En

AU - Wu, Chun Guey

N1 - Funding Information: Financial assistance from the National Science Council (NSC) of Taiwan, ROC is sincerely acknowledged. The authors are thankful to B. Kavitha for helping in preparation of manuscript. One of the authors, N. Narsimlu, is thankful to CMR College Management for giving Associate professorship.

PY - 2004/2

Y1 - 2004/2

N2 - Small angle X-ray scattering (SAXS) experimental technique is applied in obtaining the macromolecular parameters (radius of gyration Rg, radius R, specific surface area Ss and surface fractal dimension) of two polythiophene derivatives, poly(3-octylthiophene) (POTH) and poly(3,3″-dioctyl-2,2″,5′2″-terthiphene) (POTTOT) thin films. Nanosized thin films of these two polymers were prepared on glass substrate with thickness around 3.5 μm by spin coating. SAXS experiments are performed with a 18-kW rotating anode X-ray generator equipped with a Cu target. A two-dimensional proportional counter is employed to detect the scattered X-rays intensity. Analyses of SAXS data using the Guinier approximation of the radius of gyration of POTH and POTTOT particles are determined as 10.73 and 9. 99 Å, respectively. Porod approximation is used to find specific surface area of POTH and POTTOT nanostructured polymeric thin films, and they are determined as 3.61×108 and 3.00×108 cm -1, respectively. The surface fractal dimension of POTH and POTTOT thin films are calculated as 2.85 and 2.65, respectively.

AB - Small angle X-ray scattering (SAXS) experimental technique is applied in obtaining the macromolecular parameters (radius of gyration Rg, radius R, specific surface area Ss and surface fractal dimension) of two polythiophene derivatives, poly(3-octylthiophene) (POTH) and poly(3,3″-dioctyl-2,2″,5′2″-terthiphene) (POTTOT) thin films. Nanosized thin films of these two polymers were prepared on glass substrate with thickness around 3.5 μm by spin coating. SAXS experiments are performed with a 18-kW rotating anode X-ray generator equipped with a Cu target. A two-dimensional proportional counter is employed to detect the scattered X-rays intensity. Analyses of SAXS data using the Guinier approximation of the radius of gyration of POTH and POTTOT particles are determined as 10.73 and 9. 99 Å, respectively. Porod approximation is used to find specific surface area of POTH and POTTOT nanostructured polymeric thin films, and they are determined as 3.61×108 and 3.00×108 cm -1, respectively. The surface fractal dimension of POTH and POTTOT thin films are calculated as 2.85 and 2.65, respectively.

KW - Polythiophene

KW - Radius of gyration

KW - SAXS

KW - Specific surface area

UR - http://www.scopus.com/inward/record.url?scp=0346340896&partnerID=8YFLogxK

U2 - 10.1016/j.matlet.2003.07.048

DO - 10.1016/j.matlet.2003.07.048

M3 - 期刊論文

AN - SCOPUS:0346340896

SN - 0167-577X

VL - 58

SP - 1113

EP - 1116

JO - Materials Letters

JF - Materials Letters

IS - 6

ER -

Small angle X-ray scattering studies of poly(3-octylthiophene) and poly(3,3″-dioctyl-2,2″,5′2″-terthiophene) polymer thin films

Abstract

Keywords

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