SLOPE: A test pattern generator based on stop line oriented path end algorithm

Shih Jen Chuang, Chung Len Lee, Wen Zen Shen, Chein Wei Jen, Jwu E. Chen, Sen Chung Jing, Ming Der Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

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Engineering & Materials Science