SLOPE: A test pattern generator based on stop line oriented path end algorithm
- Shih Jen Chuang
- , Chung Len Lee
- , Wen Zen Shen
- , Chein Wei Jen
- , Jwu E. Chen
- , Sen Chung Jing
- , Ming Der Chen
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Scopus
citations