Simultaneous measurement of the full-field aberration

Chao Wen Liang, Pen I. Liao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


A modified grating-slit test is shown to measure the full-field aberration at multi fields simultaneously by adding a slit-lens matching array. Experimental results shows sensitivity to observe changing off-axis aberration of a tilt lens.

Original languageEnglish
Title of host publicationOptical Fabrication and Testing, OFT 2010
StatePublished - 2010
EventOptical Fabrication and Testing, OFT 2010 - Jackson Hole, WY, United States
Duration: 13 Jun 201017 Jun 2010

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


ConferenceOptical Fabrication and Testing, OFT 2010
Country/TerritoryUnited States
CityJackson Hole, WY


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