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SiC structural characterization by non destructive near-field microscopy techniques
Kuan Ting Wu, Enora Vuillermet, Elise Usureau, Youssef El-Helou, Michel Kazan, Wei Yen Woon, Mihai Lazar, Aurelien Bruyant
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review