Abstract
This work presents an efficient method to identify sequential redundant faults. The method is based on a simple procedure to identify the flip-flops which cannot be initialized and the circuit lines which cannot be controlled to definite values. The redundant faults are classified into four types and the method can identify each type of them. The method has been experimentally incorporated into a test generation system and the results show that it is very efficient in identifying redundant faults and improving the efficiency of a test generation system.
Original language | English |
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Pages (from-to) | 57-62 |
Number of pages | 6 |
Journal | Proceedings of the Asian Test Symposium |
State | Published - 1994 |
Event | Proceedings of the 3rd Asian Test Symposium - Nara, Jpn Duration: 15 Nov 1994 → 17 Nov 1994 |