Selecting the Most Reliable Design under Type-II Censored Accelerated Testing

Dong Shang Chang, Deng Yuan Huang, Sheng Tsaing Tseng

Research output: Contribution to journalArticlepeer-review

13 Scopus citations


Summaty & Conclusions-Accelerated life tests (ALTs) of products and materials are used to obtain reliability information within a reasonable time frame. However, there are no suitable selection rules for selecting the best product or material as a result of the ALT. Under the type-I1 censoring plan, this paper proposes a reasonable selection rule for an ALT using the Arrhenius model. The advantages of this selection rule are compared with a non-ALT selection rule by using as criteria, a) the average ratio of timesaving in life testing, and b) sample size. The tradeoff between an increased sample size and a shortened life testing time for the ALT selection procedure is feasible.

Original languageEnglish
Pages (from-to)588-592
Number of pages5
JournalIEEE Transactions on Reliability
Issue number4
StatePublished - Dec 1992


  • Accelerated life test
  • Selection rule


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