Robustness analysis of the FlexRay system through fault tree analysis

Kuen Long Leu, Yung Yuan Chen, Chin Long Wey, Jwu E. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The increasing importance of FlexRay systems in automotive domain inspires unceasing relative researches. One primary issue among researches is to verify the robustness of FlexRay systems either from protocol aspect or from system design aspect. However, research rarely addresses the issue that network topology selection will also cause difference in robustness. In this paper, we will illustrate how to model the robustness under various network topology adoptions by a well-known technology, fault tree analysis (FTA). Quantitative and qualitative analysis results can show the potential and suitability of FTA for modeling FlexRay systems' robustness.

Original languageEnglish
Title of host publicationProceedings of 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010
Pages30-35
Number of pages6
DOIs
StatePublished - 2010
Event2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010 - Qingdao, China
Duration: 15 Jul 201017 Jul 2010

Publication series

NameProceedings of 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010

Conference

Conference2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010
Country/TerritoryChina
CityQingdao
Period15/07/1017/07/10

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