Original language | English |
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Article number | 046102 |
Journal | Journal of Applied Physics |
Volume | 116 |
Issue number | 4 |
DOIs |
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State | Published - 28 Jul 2014 |
Response to "comment on 'Evaluation of the spatial distribution of series and shunt resistance of a solarcell using dark lock-in thermography'" [J. Appl. Phys. 116, 046101 (2014)]
Te Yuan Chung, Ching Hsiao Arthur Cheng, Chung Hao Wang
Research output: Contribution to journal › Comment/debate