Abstract
A study was conducted on AIN/GaN double-barrier resonant tunneling diodes. The diodes were grown by plasma-assisted molecular-beam epitaxy. The current-voltage characteristics were found to be sensitive to the way of voltage sweep. The strong variations in current-voltage characteristics were caused by a large piezoelectric field and electron trapping.
| Original language | English |
|---|---|
| Pages (from-to) | 3628 |
| Number of pages | 1 |
| Journal | Applied Physics Letters |
| Volume | 83 |
| Issue number | 17 |
| DOIs | |
| State | Published - 27 Oct 2003 |