Resolution enhancement in two-photon microscopy by applying structured line illumination

Chi Deng Lin, Chia Hua Yeh, Szu Yu Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

To enhance the resolution of two-photon microscopy, structured illumination was applied with a line scanning geometry. Using the square proportionality between two-photon emission and excitation intensity, a ~3-fold resolution improvement was shown in the results.

Original languageEnglish
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America (OSA)
ISBN (Electronic)1557522863
DOIs
StatePublished - 14 Oct 2014
EventLaser Science, LS 2014 - Tucson, United States
Duration: 19 Oct 201423 Oct 2014

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceLaser Science, LS 2014
Country/TerritoryUnited States
CityTucson
Period19/10/1423/10/14

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