Research and development of heterodyne dispersion meter

Shu Jen Liao; Shinn Fwu Wang; Ming Hung Chiu; Chih Wen Lai; Rong Seng Chang

doi:10.1117/12.572661

Research and development of heterodyne dispersion meter

Shu Jen Liao, Shinn Fwu Wang, Ming Hung Chiu, Chih Wen Lai, Rong Seng Chang

Department of Optics and Photonics

Research output: Contribution to journal › Conference article › peer-review

Abstract

A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.

Original language	English
Article number	30
Pages (from-to)	177-184
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5638
Issue number	PART 1
DOIs	https://doi.org/10.1117/12.572661
State	Published - 2005
Event	Optical Design and Testing II - Beijing, United States Duration: 8 Nov 2004 → 11 Nov 2004

Keywords

Dispersion
Heterodyne interferometry

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10.1117/12.572661

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abstract = "A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.",

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AU - Liao, Shu Jen

AU - Wang, Shinn Fwu

AU - Chiu, Ming Hung

AU - Lai, Chih Wen

AU - Chang, Rong Seng

PY - 2005

Y1 - 2005

N2 - A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.

AB - A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.

KW - Dispersion

KW - Heterodyne interferometry

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U2 - 10.1117/12.572661

DO - 10.1117/12.572661

M3 - 會議論文

AN - SCOPUS:19844377658

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EP - 184

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

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M1 - 30

T2 - Optical Design and Testing II

Y2 - 8 November 2004 through 11 November 2004

ER -

Research and development of heterodyne dispersion meter

Abstract

Keywords

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