A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.
|Number of pages||8|
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|Issue number||PART 1|
|State||Published - 2005|
|Event||Optical Design and Testing II - Beijing, United States|
Duration: 8 Nov 2004 → 11 Nov 2004
- Heterodyne interferometry