Research and development of heterodyne dispersion meter

Shu Jen Liao, Shinn Fwu Wang, Ming Hung Chiu, Chih Wen Lai, Rong Seng Chang

Research output: Contribution to journalConference articlepeer-review


A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.

Original languageEnglish
Article number30
Pages (from-to)177-184
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Issue numberPART 1
StatePublished - 2005
EventOptical Design and Testing II - Beijing, United States
Duration: 8 Nov 200411 Nov 2004


  • Dispersion
  • Heterodyne interferometry


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