Abstract
This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. We model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained.
Original language | English |
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Pages (from-to) | 562-566 |
Number of pages | 5 |
Journal | IEEE Transactions on Reliability |
Volume | 44 |
Issue number | 4 |
DOIs | |
State | Published - Dec 1995 |
Keywords
- Accelerated testing
- Birnbaum-Saunders distribution
- stochastic process