Reliability Prediction Using Nondestructive Accelerated-Degradation Data: Case Study on Power Supplies

Loon Ching Tang, Dong Shang Chang

Research output: Contribution to journalArticlepeer-review

58 Scopus citations

Abstract

This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. We model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained.

Original languageEnglish
Pages (from-to)562-566
Number of pages5
JournalIEEE Transactions on Reliability
Volume44
Issue number4
DOIs
StatePublished - Dec 1995

Keywords

  • Accelerated testing
  • Birnbaum-Saunders distribution
  • stochastic process

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