Reliability Challenges of Nanoscale Avalanche Photodiodes for High-Speed Fiber-Optic Communications

Jack Jia Sheng Huang, Yu Heng Jan, H. S. Chang, C. J. Ni, Emin Chou, S. K. Lee, H. S. Chen, Jin Wei Shi

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

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Engineering

Material Science