Radiation hardness of the 1550 nm edge emitting laser for the optical links of the CDF silicon tracker

M. L. Chu, S. Hou, S. C. Lee, R. S. Lu, D. S. Su, P. K. Teng

Research output: Contribution to journalConference articlepeer-review

6 Scopus citations

Abstract

Radiation hardness is investigated for the laser transmitter of the optical links used for the CDF Run II silicon tracker. Beam tests were conducted with 30, 63, and 200 MeV protons with radiation doses up to 2 Mrad. The laser transmitter consists of an edge-emitting-type laser diode array and a BiCMOS driver chip. The laser light degradation is approximately linear to the radiation dose. The light degradation is about 10% at 200 krad. The radiation tolerance is expected to suffice for the CDF Run II operation.

Original languageEnglish
Pages (from-to)208-212
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume541
Issue number1-2
DOIs
StatePublished - 1 Apr 2005
EventDevelopment and Application of semiconductor Tracking Detectors -
Duration: 14 Jun 200417 Jun 2004

Keywords

  • Optical data transmission
  • Optoelectronics
  • Radiation hardness

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