Abstract
The modulation of a photorefractive index grating, Δn, can be estimated by counting the number of peaks in the curve for the diffraction efficiency as a function of time under the phase matching condition. The accuracy for this method is about 13%. Here a new method is proposed, in which we improve the measurement accuracy to about 1%, by adding the measurement for the diffraction efficiency as a function of the angle mismatch. This precise Δn measurement allows us to quantify photorefractive effects with greater accuracy.
| Original language | English |
|---|---|
| Pages (from-to) | 1346-1349 |
| Number of pages | 4 |
| Journal | Optical Engineering |
| Volume | 41 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 2002 |
Keywords
- Grating index modulation
- Lithium niobate
- Optical storage recording materials
- Photorefractive index
- Volume holographic materials
Fingerprint
Dive into the research topics of 'Quantitative measurement for the modulation of photorefractive index gratings'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver