Abstract
The modulation of a photorefractive index grating, Δn, can be estimated by counting the number of peaks in the curve for the diffraction efficiency as a function of time under the phase matching condition. The accuracy for this method is about 13%. Here a new method is proposed, in which we improve the measurement accuracy to about 1%, by adding the measurement for the diffraction efficiency as a function of the angle mismatch. This precise Δn measurement allows us to quantify photorefractive effects with greater accuracy.
Original language | English |
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Pages (from-to) | 1346-1349 |
Number of pages | 4 |
Journal | Optical Engineering |
Volume | 41 |
Issue number | 6 |
DOIs | |
State | Published - Jun 2002 |
Keywords
- Grating index modulation
- Lithium niobate
- Optical storage recording materials
- Photorefractive index
- Volume holographic materials