Quantitative measurement for the modulation of photorefractive index gratings

Shoang C. Donn, Chung Chen Tu, Ching Cherng Sun, Ming Tsung Chen

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The modulation of a photorefractive index grating, Δn, can be estimated by counting the number of peaks in the curve for the diffraction efficiency as a function of time under the phase matching condition. The accuracy for this method is about 13%. Here a new method is proposed, in which we improve the measurement accuracy to about 1%, by adding the measurement for the diffraction efficiency as a function of the angle mismatch. This precise Δn measurement allows us to quantify photorefractive effects with greater accuracy.

Original languageEnglish
Pages (from-to)1346-1349
Number of pages4
JournalOptical Engineering
Volume41
Issue number6
DOIs
StatePublished - Jun 2002

Keywords

  • Grating index modulation
  • Lithium niobate
  • Optical storage recording materials
  • Photorefractive index
  • Volume holographic materials

Fingerprint

Dive into the research topics of 'Quantitative measurement for the modulation of photorefractive index gratings'. Together they form a unique fingerprint.

Cite this