Quality evaluation for microcrystalline silicon thin-film solar cells by single-layer absorption

Sheng Hui Chen, Ting Wei Chang, Hsuan Wen Wang

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The absorption coefficient at 1.4eV is divided by the value at 0.9eV to obtain the factor used to judge the quality of μc-Si:H. PV device performance can be predicted by multiplying V oc with I scwhen using this layer as an intrinsic layer. The results show a good relationship between the quality factor and the product of open-circuit voltage and short-circuit current. However, the final efficiency is influenced by the identities of the interface in the multilayer structure.

Original languageEnglish
Article number653501
JournalInternational Journal of Photoenergy
Volume2012
DOIs
StatePublished - 2012

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