Privacy-preserving Federated Learning for Industrial Defect Detection Systems via Differential Privacy and Image Obfuscation

Chia Yu Lin, Yu Chen Yeh, Makena Lu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Artificial Intelligence (AI) has been widely used in manufacturing to detect defects. AI models utilize product images to distinguish whether a product is normal or abnormal. If attackers use the model inversion attack to attack AI models, the input images can be roughly restored, resulting in product information leakage. In this paper, we propose a Privacy-preserving Industrial Defect Detection System (PIDS), which includes three image obfuscation methods to hide input image information and uses them to train the model. Federated learning and differential privacy are also applied to ensure that sensitive data remains decentralized and secure, even during training. Federated learning allows the model to be trained across multiple local datasets without centralized data collection, thereby reducing the risk of data exposure. Differential privacy adds another layer of protection by adding randomness to the learning process, making it hard for attackers to extract sensitive information from the trained model. Experiments show that the proposed system can achieve a high accuracy level of 96.5% in defect image classification. Therefore, the proposed system can detect defects accurately and preserve product information in terms of data and models.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE Conference on Artificial Intelligence, CAI 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1136-1141
Number of pages6
ISBN (Electronic)9798350354096
DOIs
StatePublished - 2024
Event2nd IEEE Conference on Artificial Intelligence, CAI 2024 - Singapore, Singapore
Duration: 25 Jun 202427 Jun 2024

Publication series

NameProceedings - 2024 IEEE Conference on Artificial Intelligence, CAI 2024

Conference

Conference2nd IEEE Conference on Artificial Intelligence, CAI 2024
Country/TerritorySingapore
CitySingapore
Period25/06/2427/06/24

Keywords

  • Industrial defect detection
  • differential privacy
  • federated learning
  • image obfuscation

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