Principles and applications of Ig-RTN in Nano-scaled MOSFET

Steve S. Chung, E. R. Hsieh

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Original languageEnglish
Title of host publicationNoise in Nanoscale Semiconductor Devices
PublisherSpringer International Publishing
Pages175-200
Number of pages26
ISBN (Electronic)9783030375003
ISBN (Print)9783030374990
DOIs
StatePublished - 26 Apr 2020

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