Pretest gap mura on TFT LCDs using the interference pattern method

Rong Seng Chang; Jang Zern Tsai; Tung Yen Li; Li Wei Ho; Ching Fu Yang

doi:10.1109/SII.2011.6147419

Pretest gap mura on TFT LCDs using the interference pattern method

Rong Seng Chang, Jang Zern Tsai, Tung Yen Li, Li Wei Ho, Ching Fu Yang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Mura defect is a problem in Thin Film Transistor Liquid Crystal Display (TFT LCD) panels. Many inspection methods have been utilized such as comparing the gray level or contrast but these may not show the original mura characteristics or cause of the problem. In this study we propose a method to quantize mura panel defects automatically by the shape of the interference pattern. There are three advantages to using this method: (i) decrease the loss of the liquid crystal material (ii) improve the manufacturing process (iii) save manufacturing process time.

Original language	English
Title of host publication	2011 IEEE/SICE International Symposium on System Integration, SII 2011
Pages	57-61
Number of pages	5
DOIs	https://doi.org/10.1109/SII.2011.6147419
State	Published - 2011
Event	2011 IEEE/SICE International Symposium on System Integration, SII 2011 - Kyoto, Japan Duration: 20 Dec 2011 → 22 Dec 2011

Publication series

Name	2011 IEEE/SICE International Symposium on System Integration, SII 2011

Conference

Conference	2011 IEEE/SICE International Symposium on System Integration, SII 2011
Country/Territory	Japan
City	Kyoto
Period	20/12/11 → 22/12/11

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10.1109/SII.2011.6147419

Cite this

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title = "Pretest gap mura on TFT LCDs using the interference pattern method",

abstract = "Mura defect is a problem in Thin Film Transistor Liquid Crystal Display (TFT LCD) panels. Many inspection methods have been utilized such as comparing the gray level or contrast but these may not show the original mura characteristics or cause of the problem. In this study we propose a method to quantize mura panel defects automatically by the shape of the interference pattern. There are three advantages to using this method: (i) decrease the loss of the liquid crystal material (ii) improve the manufacturing process (iii) save manufacturing process time.",

author = "Chang, {Rong Seng} and Tsai, {Jang Zern} and Li, {Tung Yen} and Ho, {Li Wei} and Yang, {Ching Fu}",

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isbn = "9781457715235",

series = "2011 IEEE/SICE International Symposium on System Integration, SII 2011",

pages = "57--61",

booktitle = "2011 IEEE/SICE International Symposium on System Integration, SII 2011",

note = "2011 IEEE/SICE International Symposium on System Integration, SII 2011 ; Conference date: 20-12-2011 Through 22-12-2011",

}

Chang, RS , Tsai, JZ, Li, TY, Ho, LW & Yang, CF 2011, Pretest gap mura on TFT LCDs using the interference pattern method. in 2011 IEEE/SICE International Symposium on System Integration, SII 2011., 6147419, 2011 IEEE/SICE International Symposium on System Integration, SII 2011, pp. 57-61, 2011 IEEE/SICE International Symposium on System Integration, SII 2011, Kyoto, Japan, 20/12/11. https://doi.org/10.1109/SII.2011.6147419

Pretest gap mura on TFT LCDs using the interference pattern method. / Chang, Rong Seng ; Tsai, Jang Zern; Li, Tung Yen et al.
2011 IEEE/SICE International Symposium on System Integration, SII 2011. 2011. p. 57-61 6147419 (2011 IEEE/SICE International Symposium on System Integration, SII 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Pretest gap mura on TFT LCDs using the interference pattern method

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AU - Tsai, Jang Zern

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AU - Ho, Li Wei

AU - Yang, Ching Fu

PY - 2011

Y1 - 2011

N2 - Mura defect is a problem in Thin Film Transistor Liquid Crystal Display (TFT LCD) panels. Many inspection methods have been utilized such as comparing the gray level or contrast but these may not show the original mura characteristics or cause of the problem. In this study we propose a method to quantize mura panel defects automatically by the shape of the interference pattern. There are three advantages to using this method: (i) decrease the loss of the liquid crystal material (ii) improve the manufacturing process (iii) save manufacturing process time.

AB - Mura defect is a problem in Thin Film Transistor Liquid Crystal Display (TFT LCD) panels. Many inspection methods have been utilized such as comparing the gray level or contrast but these may not show the original mura characteristics or cause of the problem. In this study we propose a method to quantize mura panel defects automatically by the shape of the interference pattern. There are three advantages to using this method: (i) decrease the loss of the liquid crystal material (ii) improve the manufacturing process (iii) save manufacturing process time.

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DO - 10.1109/SII.2011.6147419

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SN - 9781457715235

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T2 - 2011 IEEE/SICE International Symposium on System Integration, SII 2011

Y2 - 20 December 2011 through 22 December 2011

ER -

Pretest gap mura on TFT LCDs using the interference pattern method

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