Practical implementation of the capability index Cpk based on the control chart data

Hung Chin Lin, Gwo Ji Sheen

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Process capability indices are used to measure the ability of the process to manufacture product that meets specification requirement. Since estimated capability index is a random variable with a distribution, most practitioners look at the value of the capability index calculated from the given sample and then make a conclusion on whether the given process as capable or not which will not be reliable. In this paper, based on the theory of statistical hypothesis testing, when the process is in a state of statistical control, we propose a procedure on assessing Cpk index for practitioners to use in determining whether a given process as capable. We consider the case where process measurements are collected from the control chart data, as a sequence of independent samples. Applying Hamaker's approximation, the testing procedure can be adequately derived from a normal distribution approximation and that the more complicated distribution can be avoided. These proposed techniques would be especially applicable when the data are taken from X̄ and R, and X̄ and S control charts.

Original languageEnglish
Pages (from-to)371-390
Number of pages20
JournalQuality Engineering
Volume17
Issue number3
DOIs
StatePublished - Jul 2005

Keywords

  • Hamaker's approximation
  • p-value
  • Process capability index
  • Process mean
  • Process standard deviation

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