Power modeling and characterization method for the CMOS standard cell library

Jiing Yuan Lin, Wen Zen Shen, Ying Yang Jou

Research output: Contribution to journalConference articlepeer-review

16 Scopus citations

Abstract

In this paper, we propose power consumption models for complex gates and transmission gates, which are extended from the model of basic gates proposed in [1]. We also describe an accurate power characterization method for CMOS standard cell libraries which accounts for the effects of input slew rate, output loading, and logic state dependencies. The characterization methodology separates the power consumption of a cell into three components, e.g., capacitive feedthrough power, short-circuit power, and dynamic power. For each component, power equation is derived from SPICE simulation results where the netlist is extracted from cell's layout. Experimental results on a set of ISCAS'85 benchmark circuits show that the power estimation based on our power modeling and characterization provides within 7% error of SPICE simulation on average while the CPU time consumed is more than two orders of magnitude less.

Original languageEnglish
Pages (from-to)400-404
Number of pages5
JournalIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
StatePublished - 1996
EventProceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA
Duration: 10 Nov 199614 Nov 1996

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