Positive-bias-temperature-instability Induced Random-trap-fluctuation Enhanced Physical Unclonable Functions on 14-nm nFinFETs

E. R. Hsieh, Z. Y. Wang, Y. H. Ye, Y. S. Wu, C. F. Huang, P. S. Huang, Y. S. Huang, M. L. Miu, H. S. Su, S. Y. Huang, S. M. Lu

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