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Abstract
The multilayer HfSe2 on sapphire is first fabricated by the ion beam-assisted process combining ion implantation with the post annealing. The A1g mode of HfSe2 is shown in the Raman spectrum, the X-ray photoelectron spectroscopy results indicate the existence of Hf–Se bonding, and the transmission electron microscopy analysis exactly identifies the crystal structure of HfSe2. The six-layered (6L) octahedral HfSe2 (1T-HfSe2), whose band structure is well realized by utilizing photoluminescence spectroscopy compared with the results of the density functional theory calculation, is formed via the Hf selenization during annealing.
Original language | English |
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Article number | 1701619 |
Journal | Advanced Materials Interfaces |
Volume | 5 |
Issue number | 8 |
DOIs | |
State | Published - 23 Apr 2018 |
Keywords
- 2D materials
- ion implantation
- metal chalcogenides
- photoluminescence
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Dive into the research topics of 'Photoluminescence Characteristics of Multilayer HfSe2 Synthesized on Sapphire Using Ion Implantation'. Together they form a unique fingerprint.Projects
- 2 Finished
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Study in the Next-Generation Magnetic Memory with the High Field-Like Spin Torque Effect
1/08/17 → 31/07/18
Project: Research