Phase noise and transient measurement methods for V-band applications

Ya Wen Ou; Sy Haur Su; Yin Cheng Chang; Shuw Guann Lin; Hsu Chen Cheng; Ying Zong Juang; Da Chiang Chang; Hwann Kaeo Chiou

doi:10.1109/I2MTC.2013.6555460

Phase noise and transient measurement methods for V-band applications

Ya Wen Ou, Sy Haur Su, Yin Cheng Chang, Shuw Guann Lin, Hsu Chen Cheng, Ying Zong Juang, Da Chiang Chang, Hwann Kaeo Chiou

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This study develops a dual-path cross-correlation technique and a single-path cascade method for phase noise and transient measurements up to the V-band frequency region. Further, this paper presents the complete test setup and test procedure. Results of the analyses of the single-path cascade measurement method and the signal-to-noise ratio (SNR) floor effects are also discussed in detail. We demonstrate a good agreement between the two proposed techniques.

Original language	English
Title of host publication	2013 IEEE International Instrumentation and Measurement Technology Conference
Subtitle of host publication	Instrumentation and Measurement for Life, I2MTC 2013 - Proceedings
Pages	461-464
Number of pages	4
DOIs	https://doi.org/10.1109/I2MTC.2013.6555460
State	Published - 2013
Event	2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013 - Minneapolis, MN, United States Duration: 6 May 2013 → 9 May 2013

Publication series

Name	Conference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN (Print)	1091-5281

Conference

Conference	2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013
Country/Territory	United States
City	Minneapolis, MN
Period	6/05/13 → 9/05/13

Keywords

dual path cross correlation
phase noise
single path cascade
SNR
transient

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10.1109/I2MTC.2013.6555460

Cite this

Ou, Y. W., Su, S. H., Chang, Y. C., Lin, S. G., Cheng, H. C., Juang, Y. Z., Chang, D. C., & Chiou, H. K. (2013). Phase noise and transient measurement methods for V-band applications. In 2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013 - Proceedings (pp. 461-464). [6555460] (Conference Record - IEEE Instrumentation and Measurement Technology Conference). https://doi.org/10.1109/I2MTC.2013.6555460

Ou, Ya Wen ; Su, Sy Haur ; Chang, Yin Cheng et al. / Phase noise and transient measurement methods for V-band applications. 2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013 - Proceedings. 2013. pp. 461-464 (Conference Record - IEEE Instrumentation and Measurement Technology Conference).

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title = "Phase noise and transient measurement methods for V-band applications",

abstract = "This study develops a dual-path cross-correlation technique and a single-path cascade method for phase noise and transient measurements up to the V-band frequency region. Further, this paper presents the complete test setup and test procedure. Results of the analyses of the single-path cascade measurement method and the signal-to-noise ratio (SNR) floor effects are also discussed in detail. We demonstrate a good agreement between the two proposed techniques.",

keywords = "dual path cross correlation, phase noise, single path cascade, SNR, transient",

author = "Ou, {Ya Wen} and Su, {Sy Haur} and Chang, {Yin Cheng} and Lin, {Shuw Guann} and Cheng, {Hsu Chen} and Juang, {Ying Zong} and Chang, {Da Chiang} and Chiou, {Hwann Kaeo}",

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series = "Conference Record - IEEE Instrumentation and Measurement Technology Conference",

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note = "null ; Conference date: 06-05-2013 Through 09-05-2013",

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Ou, YW, Su, SH, Chang, YC, Lin, SG, Cheng, HC, Juang, YZ, Chang, DC & Chiou, HK 2013, Phase noise and transient measurement methods for V-band applications. in 2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013 - Proceedings., 6555460, Conference Record - IEEE Instrumentation and Measurement Technology Conference, pp. 461-464, 2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013, Minneapolis, MN, United States, 6/05/13. https://doi.org/10.1109/I2MTC.2013.6555460

Phase noise and transient measurement methods for V-band applications. / Ou, Ya Wen; Su, Sy Haur; Chang, Yin Cheng et al.

2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013 - Proceedings. 2013. p. 461-464 6555460 (Conference Record - IEEE Instrumentation and Measurement Technology Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Phase noise and transient measurement methods for V-band applications

AU - Ou, Ya Wen

AU - Su, Sy Haur

AU - Chang, Yin Cheng

AU - Lin, Shuw Guann

AU - Cheng, Hsu Chen

AU - Juang, Ying Zong

AU - Chang, Da Chiang

AU - Chiou, Hwann Kaeo

PY - 2013

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AB - This study develops a dual-path cross-correlation technique and a single-path cascade method for phase noise and transient measurements up to the V-band frequency region. Further, this paper presents the complete test setup and test procedure. Results of the analyses of the single-path cascade measurement method and the signal-to-noise ratio (SNR) floor effects are also discussed in detail. We demonstrate a good agreement between the two proposed techniques.

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KW - phase noise

KW - single path cascade

KW - SNR

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DO - 10.1109/I2MTC.2013.6555460

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SN - 9781467346221

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BT - 2013 IEEE International Instrumentation and Measurement Technology Conference

Y2 - 6 May 2013 through 9 May 2013

ER -

Ou YW, Su SH, Chang YC, Lin SG, Cheng HC, Juang YZ et al. Phase noise and transient measurement methods for V-band applications. In 2013 IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life, I2MTC 2013 - Proceedings. 2013. p. 461-464. 6555460. (Conference Record - IEEE Instrumentation and Measurement Technology Conference). doi: 10.1109/I2MTC.2013.6555460

Phase noise and transient measurement methods for V-band applications

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