Origin of the Tc-depression in ultrathin YBCO

M. Z. Cieplak, S. Guha, S. Vadlamannati, C. H. Nien, Peter Lindenfeld

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Conductance measurements on YBa2Cu3O7-δ (YBCO) between layers of Y1-xPrxBa2Cu3O7-δ [(Y-Pr)BCO] show a transition from a bulk regime in the interior of the YBCO to a surface regime near the interfaces. The depression of the zero-resistance transition temperature in ultrathin YBCO is correlated with the depressed conductance in the surface layer. The results indicate that the changes are related to the presence of the interfaces, primarily to charge transfer between the layers, with little, it any, indication of a change in the intrinsic properties of the YBCO from bulk down to the thickness of a single unit cell.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages222-228
Number of pages7
ISBN (Print)0819414522, 9780819414526
DOIs
StatePublished - 1994
EventSuperconducting Superlattices and Multilayers - Los Angeles, CA, USA
Duration: 24 Jan 199425 Jan 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2157
ISSN (Print)0277-786X

Conference

ConferenceSuperconducting Superlattices and Multilayers
CityLos Angeles, CA, USA
Period24/01/9425/01/94

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