Optical system to extract reflection coefficients and optical admittances of a thin film stack and its application in coating monitoring

Cheng Chung Lee, Kai Wu, Yu Jen Chen, Chien Cheng Kuo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Optical system to extract reflection coefficients and optical admittances of a thin film stack and its application in coating monitoring'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science